Surface Morphology of Fe(III)-Porphyrin Thin Layers as Characterized by Atomic Force Microscopy

https://doi.org/10.22146/ijc.21136

Utari Utari(1*), Kusumandari Kusumandari(2), Budi Purnama(3), Mudasir Mudasir(4), Kamsul Abraha(5)

(1) Department of Physics, Faculty of Mathematics and Natural Sciences, Universitas Sebelas Maret, Jl. Ir. Sutami 36A Kentingan Surakarta 57126 Department of Physics, Faculty of Mathematics and Natural Sciences, Universitas Gadjah Mada, Sekip Utara PO BOX BLS 21 Yogyakarta 55281
(2) Department of Physics, Faculty of Mathematics and Natural Sciences, Universitas Sebelas Maret, Jl. Ir. Sutami 36A Kentingan Surakarta 57126
(3) Department of Physics, Faculty of Mathematics and Natural Sciences, Universitas Sebelas Maret, Jl. Ir. Sutami 36A Kentingan Surakarta 57126
(4) Department of Chemistry, Faculty of Mathematics and Natural Sciences, Universitas Gadjah Mada, Sekip Utara PO BOX BLS 21 Yogyakarta 55281
(5) Department of Physics, Faculty of Mathematics and Natural Sciences, Universitas Gadjah Mada, Sekip Utara PO BOX BLS 21 Yogyakarta 55281
(*) Corresponding Author

Abstract


Surface morphology of Fe(III)–porphyrin thin layers was studied using atomic force microscopy. The thin layer samples used in these experiments were deposited by spin coating methods on indium–tin-oxide substrates at room temperature under atmospheric conditions. Variations of thin layer of Fe(III)-porphyrin were done by modifying the rotational speed and the concentration of the solution. The experimental results demonstrated that the Fe(III)–porphyrin layers were observed as discrete nanomolecular islands. Both the number of nano-islands and thickness of the layer increased significantly with increasing concentration. A layer thickness of 15 nm was obtained for low concentrations of 0.00153 M and become 25 nm for dense concentrations of 0.153 M. Conversely, the higher number of islands were deposited on the surface of the substrate at a lower rotational speed.

Keywords


Fe-porphyrin; Surface morphology; Atomic Force Microscopy (AFM)

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References

[1] Arai, T., Ishibashi, M., Kawasaki, M., and Shiba, T., 2008, Hitachi Rev., 57 (3), 108–115.

[2] Tiwari, S., and Greenham, C.G., 2009, Opt. Quantum Electron., 41 (2), 69–89.

[3] Hart, H., Craine, L.E., and Hart, D.J., 2003, Organic Chemistry: A Short Course, Houghton Mifflin Company, New York, 418–423.

[4] Palmer, R., and Guo, Q., 2002, Phys. Chem. Chem. Phys., 4 (18), 4275–4284.

[5] Gong, X., Milic, T., Xu, C., Batteas, J.D., and Drain, C.M., 2002, J. Am. Chem. Soc., 124 (48), 14290–14291.

[6] Duong, B., Arechabaleta, R., and Tao, N.J., 1998, J. Electroanal. Chem., 447 (1-2), 63–69.

[7] Fagadar-Cosma, E., Mirica, M.C., Balcu, I., Bucovicean, C., Cretu, C., Armeanu, I., and Fagadar-Cosma, G., 2009, Molecules, 14 (4), 1370–1388.

[8] Goya, M.C., Lucero, M., Orive, A.G., Marin, A., Gimeno, Y., Creus, A.H., Aguirre, M.J., Arévalo, M.C., and Armijo, F., 2011, Int. J. Electrochem. Sci., 6 (10), 4984–4998.

[9] van Hameren, R., van Buul ,A.M., Castriciano, M.A., Villari, V., Micali, N., Schön, P., Speller, S., Scolaro, L.M., Rowan, A.E., Elemans, J.A.A.W., and Nolte, R.J.M., 2008, Nano Lett., 8 (1), 253–259.

[10] O’Sullivan, M.C., Sprafke, J.K., Kondratuk, D.V., Rinfray, C., Claridge, T.D.W., Saywell, A., Blunt, M.O., O’Shea, J.N., Beton, P.H., Malfois, M., and Anderson, H.L., 2009, Nature, 469 (7328), 72–75.

[11] Wang, X., Wang, G.C., and Lewis, K.M., 2012, Mater. Chem. Phys., 136 (1), 190–195.

[12] Ditze, S., Röckert, M., Buchner, F., Zillner, E., Stark, M., Steinrück, H.P., and Marbach, H., 2013, Nanotechnology, 24 (11), 1–11.

[13] Bernien, M., Xu, X., Miguel, J., Piantek, M., Eckhold, Ph., Luo, J., Kurde, J., Kuch, W., Baberschke, K., Wende, H., and Srivasta, P., 2007, Phys. Rev. B, 76 (21), 214406-1–214406-6.

[14] Gatteschi, D., 2007, Nat. Mater., 6 (7), 471–472.

[15] Wende, H., Bernien, M., Luo, J., Sorg, C., Ponpandian, N., Kurde, J., Miguel, J., Piantek, M., Xu, X., Eckhold, P., Kuch, W., Baberschke, K., Panchmatia, P.M., Sanyal, B., Oppeneer, P.M., and Eriksson, O., 2007, Nat. Mater., 6 (7), 516–520.

[16] Bernien, M., Miguel, J., Weis, C., Ali, Md.E., Kurde, J., Krumme, B., Panchmatia, P.M., Sanyal, B., Piantek, M., Srivastava, P., Baberschke, K., Oppeneer, P.M., Eriksson, O., Kuch, W., and Wende, H., 2009, Phys. Rev. Lett., 102 (4), 0472021–0472024.

[17] Ferradás, R., García-Suárez, V.M., and Ferrer, J., 2013, J. Phys. Condens. Matter., 25 (32), 325501.

[18] Danilovic, D., Lin, C.L., Yuen, T., Pan, L., and Li, J., 2007, J. Appl. Phys., 101 (9), 09E1031–09E1033.

[19] Herper, H.C., Bernien, M., Bhandary, S., Hermanns, C.F., Krüger, A., Miguel, J., Weis, C., Schmitz-Antoniak, C., Krumme, B., Bovenschen, D., Tieg, C., Sayal, B., Weschke, E., Czekelius, C., Kuch, W., Wende, H., and Eriksson, O., 2013, Phys. Rev. B, 87 (17), 174425.

[20] Baberschke, K., 2009, J. Phys. Conf. Ser., 190 (1), 012012-1–012012-10.

[21] Podzorov, V., Menard, E., Rogers, J.A., and Gershenson, M.E., 2005, Phys. Rev. Lett., 95 (22), 226601.

[22] Neidermeier, U., Baghnich, S.A., Melzer, C., Serfert, W., and Seggern, H., 2010, Synth. Met., 160 (3-4), 251–255.

[23] Kozlova, N.V., Mori, N., Makarovsky, O., Eaves, L., Zhuang, Q.D., Krier, A., and Patanè, A., 2012, Nat. Commun., 3, 1–5.

[24] Niedemeier, U., Vieth, M., Pätzold, R., Sarfert, W., and von Seggern, H., 2008, Appl. Phys. Lett., 92 (19), 193309.

[25] Siles, P.F., Bufon, C.C.B., Grimm, D., Jalil, A.R., Mende, C., Lungwitz, F., Salvan, G., Dietrich, R.T.Z., Lang, H., and Schmidt, O.G., 2014, Org. Electron., 15 (7), 1432–1439.

[26] Li, Z., Park, T.H., Rawson, J., Therien, M.J., and Borquet, E., 2012, Nano Lett., 12 (6), 2722–2727.

[27] Yuen-Zhou, J., Saikin, S.K., Yao, N.Y., and Aspuru-Guzik, A., 2014, Nat. Mater., 13 (11), 1026–1032.

[28] Kalimuthu, P., Sivanesan, A., and John, S.A., 2012, J. Chem. Sci., 124 (6), 1315–1325.

[29] Drain, C.M., Bazzan, G., Milic, T., Vinodu, M., and Goeltz, J.C., 2005, Isr. J. Chem., 45 (3), 255–269.

[30] Yin, J., Guo, Q., and Palmer, R.E., 2003, J. Phys. Chem. B, 107 (1), 209–216.

[31] Horcas, I., Ferńandez, R., Gómez-Rodrigues, G.J.M., Colchero, J., Gómez-Herrero, G.J., and Baro, A.M., 2007, Rev. Sci. Instrum., 78 (1), 013705-1–013705-8.



DOI: https://doi.org/10.22146/ijc.21136

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